Testing Solutions

  1. IC Test Probes; 80 Designs (013)
  2. ICT Test Probes; 70 Designs (013)
  3. General Final Test (013)
  4. Wafer Level Test; Min Pitch 0.012mm (013)
  5. Burn-In Test ≤ 180°C (013)
  6. High Frequency (RF) Testing ≤ 77 GHz (013)
  7. Battery Probes 30 Designs (013)
  8. Memory Testing DDR SDRAM, Flash, etc. (013)
  9. High Current IC Test > 5 Amps (013)
  10. Fine Pitch Connector Test ≤ 0.3mm (013)
  11. Kelvin Contact Test 0.07 ~ 0.1mm (013)
  12. ATE Connecting Solutions Pogo Tower & Adapter (013)
  13. Panel Test Solutions Min Pitch 0.45mm (013)